Describes the properties of electron microscopy This class serves as DTO and contains information about general electron microscope parameters during an image analysis. This class shall be extended, if you need to add more technology-specific properties.
| Type | Name and description |
|---|---|
java.lang.Integer |
acceleratingVoltageVoltage is used to accelerate electrons. |
java.lang.Float |
cumulativeElectronDoseThe accumulated amount of electrons that are applied to an area of the sample |
java.lang.Float |
targetDefocusShift of focus of the objective lens. |
| Constructor and description |
|---|
ElectronMicroscopyParameters
(java.lang.Integer binning, java.lang.Integer acceleratingVoltage, java.lang.Float targetDefocus, java.lang.Float cumulativeElectronDose)Creates a description of the properties of electron microscopy |
Voltage is used to accelerate electrons. Applied between cathode and electrode in the acceleration tube e.g 120 kV
The accumulated amount of electrons that are applied to an area of the sample Measured in electrons per unit area e.g 100 electrons/Angstrom^2
Shift of focus of the objective lens. It is used to observe 'Fresnel fringes', for taking lattice image or structure images. The defocus value is a parameter of the contrast transfer function in electron microscopy. This could be for example -4 nm. Usually this value is negative.
Creates a description of the properties of electron microscopy
binning - ElectronMicroscopyParameters.binningacceleratingVoltage - ElectronMicroscopyParameters.acceleratingVoltagetargetDefocus - ElectronMicroscopyParameters.targetDefocuscumulativeElectronDose - ElectronMicroscopyParameters.cumulativeElectronDoseGroovy Documentation